Optical constants change in As40Se60 and As50Se50 : A comparative study by FTIR and XPS

Ramakanta Naik; C. Sripan; R. Ganesan

Volume 3, Issue 7 , August 2018, , Pages 458-463

http://dx.doi.org/10.5185/amp.2018/6529

Abstract
  In this manuscript, the As40Se60 and As50Se50 samples of 800nm thickness were deposited onto glass substrate by thermal evaporation technique. The as-deposited films were characterized using X-ray diffraction (XRD) and FTIR Spectrophotometer. The prepared samples are amorphous type. The transmission ...  Read More

Influence of Bi addition on the optical properties of As40Se60 thin films

Mukta Behera; Rozalin Panda; Naresh C. Mishra; Ramakanta Naik

Volume 1, Issue 2 , November 2016, , Pages 200-204

http://dx.doi.org/10.5185/amp.2016/216

Abstract
  In the present work, structural, microstructural, compositional and electronic band gap properties of As40Se60 and As40Bi15Se45 bulk and thin films are reported. The films were prepared by thermal evaporation technique under high vacuum. X-ray diffraction (XRD) study indicated amorphous nature of As40Se60 ...  Read More