Document Type : Research Article


Department of Physics, Utkal University, Bhubaneswar, 751004, India


In the present work, structural, microstructural, compositional and electronic band gap properties of As40Se60 and As40Bi15Se45 bulk and thin films are reported. The films were prepared by thermal evaporation technique under high vacuum. X-ray diffraction (XRD) study indicated amorphous nature of As40Se60 in bulk prepared by melt quenching technique. Bi incorporation in As40Se60 with composition Bi15As40Se45 however led to nucleation of Bi2Se3 nanocrystallites in the amorphous matrix of As40Se60. The films made out of the two targets of composition As40Se60 and As40Bi15Se45 did not show any XRD peak, indicating their amorphous nature. UV-Visible-NIR spectroscopic study indicated a large decrease in the electronic band gap from 1.74 eV in films of composition As40Se60 to 1.28 eV for compositon Bi15As40Se45. This decrease is explained on the basis of a high concentration of defect states leading to the presence of localized states in the band gap due to Bi incorporation. Field emission scanning electron microscopy (FESEM) images show smooth and homogeneous surface for the As40Se60 films, while Bi incorporation led to increases of the surface roughness in the Bi15As40Se45 films. The decreased band gap and increased surface roughness on Bi incorporation in As40Se60 films indicate the suitability of these films for solar cell applications.                               


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