Authors

1 Optical Devices and Systems, CSIR-Central Scientific Instruments Organization, Chandigarh, 160030, India Academy of Scientific and Innovative Research (AcSIR), CSIR-CSIO, Chandigarh, 160030, India

2 Optical Devices and Systems, CSIR-Central Scientific Instruments Organization, Chandigarh, 160030, India Indian Institute of Technology Delhi, Hauz Khas, New Delhi, Delhi 110016, India

Abstract

Subsurface Damage (SSD), which is introduced to optical materials by diamond turning processes, affects the performance in optical, laser and infrared applications. For optical applications, SSD can be the source of component instability (e.g., surface stress) and flaw. The objective of the present study is to investigate the subsurface damage in silicon. Interferometry and Raman Spectroscopy are used to detect the surface finish and SSD. The surface roughness of 0.243 nm is achieved at best combination.  A sharp Raman shift at 409 cm-1 is obtained, which reveals that a thin layer of Silicon has transformed to amorphous state resulting in subsurface damages. Copyright © 2017 VBRI Press.

Keywords

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