Optical constants change in As40Se60 and As50Se50 : A comparative study by FTIR and XPS

Ramakanta Naik; C. Sripan; R. Ganesan

Volume 3, Issue 7 , 2018, , Pages 458-463

https://doi.org/10.5185/amp.2018/6529

Abstract
  In this manuscript, the As40Se60 and As50Se50 samples of 800nm thickness were deposited onto glass substrate by thermal evaporation technique. The as-deposited films were characterized using X-ray diffraction (XRD) and FTIR Spectrophotometer. The prepared samples are amorphous type. The transmission ...  Read More